JEOL Launches Scanning Electron Microscopes JSM-IT710HR/JSM-IT210 - Further Advancements Improve Efficiency by Leaving Observation and Analysis to the Equipment

JEOL Ltd. (President and CEO: Izumi Ooi, Securities Code: 6951) will begin selling the JSM-IT710HR/JSM-IT210 scanning electron microscope on July 23, 2023.

Scanning electron microscopes (SEM) are used for a wide range of purposes, from basic research to manufacturing sites, from quality assurance to R&D, and in a wide variety of fields, including metals, semiconductors, batteries, biotechnology, and polymers. The need for easier confirmation of compositional information without awareness of analysis as well as observation is further increasing.

With the improved stability of the electron gun in the JSM-IT710HR and the 5-axis motorized sample stage in the JSM-IT210, both models have evolved automatic measurement functions for observation and analysis, greatly enhancing the overall capabilities of scanning electron microscopes.

This new model meets the recent market demand for automation and contributes to increased efficiency in routine work.

■Main Features

1) "Simple SEM" for automated acquisition of SEM images and EDS analysis

This function automatically acquires SEM images and EDS (Energy Dispersive X-ray Spectroscopy) analysis by simply selecting the SEM image acquisition conditions and field of view. This function contributes to the efficiency of routine work, including analysis work. 2.

2. "Live 3D" to create 3D images on the spot

3D images can be constructed on the spot while observing SEM to obtain unevenness and depth information. 3.

3. conventional system Optical image of an area about 5 times larger than that of the conventional system "Stage Navigation System LS

The optical image of the sample is acquired, and the user can move to the desired observation field of view by simply clicking on the optical image. The optical image of an area about 5 times larger than that of a conventional stage navigation system can be acquired. 4.

4) "Low-Vacuum Hybrid Secondary Electron Detector (LHSED)" to acquire detailed information on unevenness even under low vacuum conditions

By detecting the electrons and excitation light generated when secondary electrons collide with residual gas molecules, detailed information on unevenness can be obtained even under low vacuum conditions.

5. 5-axis motorized sample stage

A 5-axis motorized sample stage is equipped as standard, enabling SEM image acquisition and EDS analysis of uneven samples.

6. improved electron gun stability (JSM-IT710HR)

The electron beam stability has been further improved to support long-term continuous automatic operation using a specimen holder that can hold multiple specimens at the same time.

JSM-IT710HR

JSM-IT210

Standard Price

JSM-IT710HR: Standard price 39,000,000 yen and up (including tax)

JSM-IT210: Standard price of the main unit: 15,000,000 yen and up (including tax)

Planned sales volume

JSM-IT710HR: 150 units/year

JSM-IT210 : 250 units/year

Company Profile

Company name : JEOL Ltd.

Location: 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan

Representative: Izumi Ooi, President and CEO

Establishment: May 30, 1949

Capital: 21,394.18 million yen (as of March 31, 2023)

Business Description: Scientific measuring instruments (electro-optical instruments, analytical instruments, and measuring and inspection instruments),

　　　　　 Manufacturing, sales, development and research of semiconductor-related equipment, industrial equipment, and medical equipment,

　　　　　 and related products, outsourced processing of parts, maintenance, and services,

　　　　　 Purchase and sales of peripheral equipment

URL: https://www.jeol.co.jp/

For inquiries regarding this matter, please contact

JEOL Ltd. Scientific & Measuring Instruments Sales Division

Inquiry form: https://www.jeol.co.jp/contacts/products.html